Publications

Overview of SA

Using SA means comprehensive and common instrument interfaces for those instruments you mentioned plus laser scanner interfaces and portable arms. SA also opens up multiple synchronized instruments applications along with scripted process automation. The software to accomplish these applications is proven and ready to implement on production applications. The measurement plan script interface was specifically created to enable what we call Big Button metrology applications. Effectively simplifying the process so that folks dont have to be experts to collect and analyze data efficiently.

Application White Paper: 6D-Tracking Probe CMM Delivers Accurate Cost Effective Solutions

Laser Trackers with 6D-Tracking Probes are displacing large-bed CMMs in the industrial metrology market. They deliver flexible tighter precision metrology solutions in large volumes were a large fixed bed CMM is prohibitively expensive to implement. 6D-Tracking Probes Laser Trackers bring direct CAD Build and In-Process Verification to an organizations capabilities where fixed CMMs are typically limited to inspection tasks.

Integrated CAD-Metrology and Alignment of Key Features of A380 Wings

Aligning features within the A380 wing system is achieved by modeling their interdependence and relative importance with Relationships. Each relationship has an inherent local frame to aid its model of the interaction between key kinematic mechanisms and critical interface features. The As-Built configuration is optimized to its nominal CAD model on the shop floor. The process simultaneously fits the constraints defined by the relationships. The relative importance of each constraint is controlled using weights set by the production team.

CMSC 2004 Large Scale Metrology Workshop presentation by Ron Hick, General Forman, Northrop Grumman -- Newport News. Shipbuilding with large scale metrology systems and uncertainty evaluation on the shop floor.

Spatial coordinate metrology systems play an important role in many manufacturing and certification processes. The goal of this work is to develop a method for quantifying the uncertainty fields associated with coordinate data comprised of measurements from different systems.

Simultaneous Design Constraint Optimization using Weighted Feature to Measurement Relationships

The best orientation of the measurement of real parts to the design geometry can be found by simultaneously optimizing the measured points against the constraints defined by relationships. The optimization will yield the best spatial transformation that minimizes the relationships and helps manufacturing produce the best parts and assemblies.

Computer Aided-Design-Manufacturing & Measurement Integration

This paper describes the Computer Aided-Design-Manufacturing and Measurement Integration pilot development activities conducted Boeing and NRK. The goals of this study were to integrate and evaluate 3-Dimensional measurement software, measurement hardware (Laser Trackers, PCMMs) and CATIA Digital Product Definition (DPD) datasets, into the build, measurement and inspection process.

The integration of the MV Laser Scanner with a robotic manipulator allows the scanner to cover large areas and eliminate occlusions in an automated inspection process. The SpatialAnalyzer metrology platform provides an integration of these two technologies through its modular architecture.

Weighted trilateration numerical methods can improve measurement uncertainties with commercial Laser Tracking Interferometer systems on large parts to 5 microns (1-sigma).

This paper will describe a position and orientation (6D) tracking system developed to aid in the assembly of large aerospace components. The tracking capabilities are achieved by simultaneously acquiring coordinate data from three synchronized laser tracker systems.

This paper describes the development and implementation of DMS for the 747 FAIT program.

This paper describes a procedure used to determine the measurement uncertainties of spherical measurement systems.

This presentation focuses on Critical Standardization Issues for portable metrology equipment.