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SA Instrument Interfaces

SA Instrument Interfaces are separate applications responsible for connecting, configuring, controlling, and collecting all available data from the instruments. Each interface shares a common user interface making it easy for an operator to use the best metrology system for the specific task. The interface connects to the instrument and establishes a network session with SA. Since the connection with SA is a network session (TCP/IP) any number of interfaces can run simultaneously and from any computer on the network. This effectively means any number and combination of instruments can be connected and taking data at the same time.

Laser Tracker Interface

Common UI for all Trackers
Initialize Instruments
Full ADM >> Auto-Measure and Locate
Configurable Measurement Profiles
3D @ up to 1000 Hz
Integrated Op-Checks and System Status
Target and Reflector database
ADM Offset Compensation
Automatic Wavelength Compensation
Weather-Station Recording and Compensation
Level Tracking and Compensation
Automated with Measurement Plan

Manufacturer	Tracker Models	Accessories
API	Tracker I, II Plus	Camera, Intelli-Probe, Weather Monitor, Level Compensator, Remote Point
FARO	SI, SI2, Tracker X	Level Compensator, Part and Air Temperature Probes, Remote Point
FARO	SMX 3000, 4000, 4500	Level Compensator, Temperature Probes, Remote Point
Leica	LTD-300, 500, 600, 700, and 800	LT-NetBEUI & EmScon Controllers T-Probe, T-Cam, Video Camera, Nivel Level, Thommen and Davis Weather Stations, Remote Point

Portable Coordinate Measuring Machine Interface

Common UI for all Arms
Integrated Op-Checks and System Status
Automated with Measurement Plan
Dynamic Animation of Arm Model in SA
Integrated Transformations
Speech Prompting Support
In-process QA of Measurement Confidence
Automatic Feature Measurements
- Patch
- Hole
- Pin
- Slot
- Circle
- Plane
- Sphere
- Cross Section

Manufacturer	PCMM Models	Accessories
FARO	Platinum, Titanium, Advantage, ScanArm	USB Interfaces, Scanners
ROMER-CimCore Hexagon	INFINITE, STINGER II, 3000i, 2000i, 1000i	LSI Scanners, Fixed Probe, Tube Probe
Sandia National Labs	Sandia National Labs Arm

MetricVision Scanner Interface

Metrology and Vision Scan Modes
+12 Target Types
Automated Contour and Cross-Section Following
Environment Monitoring, Logging, and Compensation
Integrated Ops-Checks
Automated Feature Extraction
Drive process with Measurement Plans
Cloud-Viewer à dense scans (>10,000,000 points)
In-process QA of Measurement Confidence
Scan bounding using defined perimeters
Calibrated video for hole measurement
Mirror function allows you to scan through a mirror.
Multi-Lingual support

Arcsecond Local GPS Network

Direct Real-Time Interactive Link with Control Center
Multi-Server Interface
Integrates n-Receivers into Real-Time position and orientation feedback loop
Cylindrical, Flat, and Vector Bar Probes
Trans-Track Compatibility
Build Mode -- Watch Windows
Stable Point Measurement Mode
Integrated Uncertainty Warning
Visualize Receiver Measurement Uncertainty
Simple to Complex Network Orientations
Integrated Ops-Checks

Area Laser Scanner Interface

Integrated Turn Table for 360° scans
High data rates: SCSI interface
Incorporates color video image
Automated Feature Extraction à edges, spheres, planes, circles etc.
Integrate multiple scanners for simultaneous use
Turn-Table Interface and Alignment
Measurement Configuration Database
Cloud-viewer for large point clouds
Integrated Ball Plate Ops-Check
Drive process with Measurement Plans
Scanner Noise Reduction Filtering (JWP)
Automatic Feature Detection, Extraction, Analysis
Auto-Correspondence of Point Groups

Manufacturer	Models	Accessories
Minolta	VIVID 700 & 900	Auto-Focus method, Scan Range

Theodolite + Total Station Interface

Common UI
Instrument keyboard and Computer Control
Build Mode
Auto-Measure and Drive File Modes
Prompted List Measure Mode
Simple to Complex Network Orientations
Integrated Ops-Checks

Manufacturer	Models	Accessories
Cubic	KIT	Adhesive Targets, Vector Targets
Lecia	T1800, T2000, TC2000, T2002, TC2002, TPS2003, T3000, TPS5000, TPS5005, T5100	Adhesive Targets, Plastic Targets, 2 Point Vector Target, Rotary Target. CPS12 High Precision Prism, RT1A High Precision Target
Kern	E2	Adhesive Targets, Vector Targets
Sokkia	Net-2	Adhesive Targets, Plastic Targets, 2 Point Vector Target, Rotary Target. Magnetic Base Target,CPS12 High Precision Prism,RT1A High Precision Target
Zeiss	Rec Elta 13Ci, ETh2	Adhesive Targets, Vector Targets

Videogrammetry

Common UI
Instrument keyboard and Computer Control
Build Mode

Manufacturer	Models	Accessories
Geodetic Services Inc	S-Mode (file import)	Retro-Targets, Vector Targets, Offset Optical Targets
Geodetic Services Inc	M-Mode	AutoProbes, hand-held probes, Pro-Spot Projector
AICON 3D Probe	ProCam	Target Probes, Target Panels
Krypton	K610-CMM	6DOF probe CMM

Auxiliary Data Interfaces

Common UI between systems
Master/Slave and Polled Mode with other measurement system
Automated with Measurement Plan
Instrument keyboard and Computer Control
Watch and Build Mode

Manufacturer	Models	Accessories
Krautkramer Ultrasonic Thickness Gage	CL400	Precision thickness gauge combines signal processing with compatible, damped, single element transducers.
Davis Weather Station	Perception II	Monitors indoor climate e.g., Temperature and Pressure.
On-Trak Laser Line	OT-4040 OT-6000	Provides simultaneous, real-time measurement of multiple targets along a single reference laser line. Displays the X-Y deviation of each measurement target via your computer or optional handheld data terminal.
Thommen Weather Station	HM-30	Measure absolute pressure, ambient temperature and humidity.
Leica Two-Axis Level	Nivel 20	Inclination sensor using an optoelectronic principle. The reference plane is provided by a fluid perpendicular to the true vertical.

Each interface connects to the instrument and establishes a network session with SA. Since the connection with SA is a network session (TCP/IP) any number of interfaces can run simultaneously and from any computer on the network. This effectively means any number and combination of instruments can be connected and taking data at the same time.

The object oriented nature of SA enables a number of key capabilities for instrument interfaces. Each interface shares a common user interface making it easy for an operator to use the best metrology system for the specific task. Having a common interface between instruments means minimizing training and producing results. Getting features from different instruments combined into the common interfaces makes the SA interfaces more capable for general applications.

Summary of SA’s Instrument Interfaces Capabilities

Common UI for instrument type
Multiple On-Line Instruments
Distributed Computing Open Architecture
Automated In-Process Inspection
Direct CAD Controlled Assembly Automation
Real-Time 6D Control of Assembly Process
Build Closed-loop with design features
Programmable Measurement Plan Scripting
Automated Feature Detection-Extraction-Analysis
Environment Monitoring, Logging, Compensation
Traceability and Uncertainty Analysis
Measurement Process Simulation